The Ejection Electron Gun (FEG) ensures excellent resolution and different contrast information, including directional backscattering, STEM and cathode fluorescence information, can be adjusted through different detector options. The images from multiple detectors and different detectors can be collected and displayed simultaneously, so that the sample information can be obtained in a single scan, thus reducing the beam exposure of electron beam sensitive samples and realizing true dynamic test. The three vacuum modes make the system extremely flexible and can accommodate a wide range of sample types, providing reliable analysis results regardless of whether the sample is conductive, insulated, moist or at high temperature. The hardware has user wizard support, not only can guide the operator, but also can be directly exchanged, easily shorten the result retrieval time.
Metals and alloys, fractures, solder joints, polished sections, magnetic and superconducting materials
Ceramics, composite materials, plastics
Film/Coating
Geological sample section, minerals
Soft materials: polymers, drugs, membranes, gels, biological tissues, plant materials
Particles, porous materials, fibers
Hydration/dehydration/wetting/contact Angle analysis
Crystallization/Phase Change
Oxidation/catalysis
Material generated
Stretch (with heating or cooling)
High resolution field emission scanning electron microscopy with environmental vacuum mode (ESEM) for preparation of materials in their natural state;
Shorten sample preparation time: Low vacuum and ambient vacuum technologies allow direct imaging and analysis of non-conductive and/or aqueous samples with no charge accumulation on the sample surface;
Conductive and non-conductive samples are analyzed in various operating modes, and secondary electron images and backscattered electron images are obtained synchronously.
Excellent analysis performance, sample chamber can be installed at the same time 3 three EDS detectors, two EDS ports are separated from 180°, WDS and co-EDS /EBSD;
Excellent analysis performance for non-conductive samples: Accurate EDS and EBSD analysis in low vacuum mode with the "differential pressure vacuum system";
Flexible, accurate center sample table, 105° tilt Angle range, can observe the sample in all directions;
The software is intuitive and easy to use, and the user wizard and Undo (Undo) function are configured to reduce the operation steps and make the analysis faster.
New innovative options, including retractable RGB cathode fluorescence (CL) detectors, 1100 ° C high vacuum heat table and AutoScript;
