With versatility and high quality imaging performance, an innovative final stage lens design is adopted. The introduction of electrostatic final stage lens supports high-resolution detection in the lens barrel, and imaging and analysis performance can be achieved even for magnetic samples. The new step optimizes ultra-high resolution imaging capabilities and adds a number of new features to improve its ease of use. The introduction of SmartalIGN (intelligent centering) technology on the durable SEM platform eliminates the need for manual adjustments, and Flash automatically performs fine adjustments, with the necessary lens centering, image defocusing and focus correction done with just a few mouse moves. In addition, it is a SEM with a resolution of 1nm at a working distance of 10mm. A long working distance no longer means low-resolution imaging. The system can also upgrade the real-time element spectrum/graph imaging function, which completely subverts the inherent elemental analysis process of traditional SEM-EDS over the past decades and improves the efficiency of elemental analysis by more than two times. Analytical results can be easily obtained by any user.

Emission source: high - stability schottky base - field emission electron gun
Acceleration voltage range: 200 V ~ 30 KV
Landing voltage range: 200 eV ~ 30 keV
Probe current range: 1 Pa ~ 50 nA, continuously adjustable (optional 400 nA)
Horizontal field width: 10 mm, 3 mm at WD (equivalent to 29 times minimum magnification)
X-Ray working distance: 10 mm, EDS detection Angle 35°
Sample room: a large storage space 340mm wide from left to right. The number of expandable interfaces in the sample room is 12, including 3 interfaces for energy spectrometer (2 of which are in a diagonal 180° position).
Sample table: Five-axis excellent center automatic motor drive X=110 mm,Y=110 mm,Z=65 mm,T=-15o~90o,R=360o (continuous rotation)
Multi-purpose SEM sample mounting loading platform, can place 18 standard sample stands (Φ12mm) at the same time

Detector system:
Sample chamber secondary electron detector ETD
Backscattering electron detector T1 in mirror cylinder
Secondary electron detector T2 in the mirror cylinder
Secondary electron detector T3 in mirror cylinder (optional)
IR-CCD infrared camera in the sample room (observe the height of the sample table)
Image navigation color optical camera NAV-CAM +™
Secondary electron detector with low vacuum in sample chamber (optional)
Backscatter detector under retractable lens (optional)

Control system:
Operating system: Windows 10
Image display: 24 inch LCD display, display resolution 1920×1200
Support for user-defined GUI to display up to four images in real time
The software supports Undo and Redo functions

Comprehensive analytical
Comprehensive nano and subnano resolution performance, suitable for nanoparticles, powders, catalysts, nano devices, bulk magnetic samples and other materials;

Flexibility
Extremely flexible to handle a wide range of sample types, including insulator, sensitive material, or magnetic samples, and to collect the most important data for your application;

SmartAlign technology
Using SmartalIGN technology (intelligent adjustment of optical system), the optical system can be automatically adjusted to reduce maintenance time;

Automation
Automation including Flash automatic image fine-tuning, undo, user wizard, MAPS imaging splicing Flash technology;

Real-time quantitative EDS
The element information is within easy reach. Using ColorSEM technology, the real-time element surface distribution imaging quantitative analysis is provided, and the results are obtained more quickly and easily.

Standard workflow operations
Built-in User Guidance (User workflow) function, whether beginners or experienced, can quickly start, and stable access to experimental data.