TEM transmission electron microscope-Shen Gao Co., Ltd.-Official website

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TEM transmission electron microscope

Product overview

Offers unmatched capabilities for extreme bulk 3D analysis, GA-free sample preparation, and precision micromachining. With its innovative, fully integrated femtosecond laser, which provides material removal rates and cutting surface quality, it is a high-quality sub-surface and three-dimensional characterization device in the millimeter scale range with nanometer resolution.

Product details

The material removal rate for millimeter cross section material removal is 15,000 times faster than typical Ga + Fib

Statistically relevant subsurface and three-dimensional data analysis is achieved by collecting larger volumes in less time

Accurate, repeatable cutting position with three beams intersecting at the same point on the sample

Rapid characterization of deep subsurface features can be achieved by extracting TEM slices or blocks below the surface for 3D analysis

Achieving high throughput handling of challenging materials such as nonconductive or sensitive to ion beams

Achieving a fast and simple characterization of air-sensitive samples without the need to transfer samples between different instruments for imaging and cross-section acquisition

All features of the platform are very reliable, including high quality gallium-free TEM and APT sample preparation and extremely high resolution imaging capabilities

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